• DocumentCode
    3346978
  • Title

    Experimental optimization of the performance and reliability of stand-alone photovoltaic systems

  • Author

    King, David L. ; Hund, Thomas D. ; Boyson, William E. ; Kratochvil, Jay A.

  • Author_Institution
    Sandia Nat. Labs., Albuquerque, NM, USA
  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1428
  • Lastpage
    1431
  • Abstract
    Stand-alone photovoltaic systems are deceptively complex. Optimizing the performance and reliability of these systems requires a complete understanding of their behavior as a function of site-dependent environmental conditions. Individual component specifications provide useful design information. However, to fully understand the interactions between components, it is necessary to simultaneously characterize the performance of the system and its separate components under actual operating conditions. This paper describes how a new 30-day outdoor testing procedure was coupled with array performance modeling to accomplish this objective. The procedure measures battery capacity, determines appropriate set-points for charging, and based on daily intervals quantifies DC-energy available from the array, charge-controller efficiency, battery efficiency, inverter efficiency, overall system efficiency, days of autonomy, and AC-energy available by month.
  • Keywords
    energy conservation; photovoltaic power systems; power system reliability; secondary cells; solar cell arrays; testing; 30 day; AC-energy; DC-energy; array performance modeling; battery capacity measurement; battery efficiency; charge-controller efficiency; inverter efficiency; outdoor testing procedure; overall system efficiency; reliability; site-dependent environmental conditions; stand-alone photovoltaic systems; Batteries; Inverters; Laboratories; Meteorology; Optical arrays; Photovoltaic systems; Safety; Temperature; Testing; Wind speed;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190877
  • Filename
    1190877