Title :
Laser Closing of Window as a Novel Wafer-Level Hermetic Packaging Technology
Author :
Cheung, K.P. ; Wang, Y. ; Pai, C.S.
fDate :
May 31 2005-June 3 2005
Keywords :
CMOS technology; Chemical technology; Costs; Encapsulation; Microelectromechanical devices; Micromechanical devices; Packaging; Protection; Temperature; Wafer scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location :
Lake Buena Vista, FL
Print_ISBN :
0-7803-8907-7
DOI :
10.1109/ECTC.2005.1441324