DocumentCode
3347020
Title
Commonly observed degradation in field-aged photovoltaic modules
Author
Quintana, M.A. ; King, D.L. ; McMahon, T.J. ; Osterwald, C.R.
fYear
2002
fDate
19-24 May 2002
Firstpage
1436
Lastpage
1439
Abstract
Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.
Keywords
adhesion; failure analysis; interconnections; moisture; packaging; semiconductor devices; solar cell arrays; adhesional loss; field-aged photovoltaic modules; interconnects degradation; module degradation rates; module failures; moisture intrusion; packaging materials; photovoltaic modules degradation; photovoltaic modules failure; semiconductor device degradation; Conducting materials; Degradation; Laboratories; Moisture; Performance loss; Photovoltaic systems; Renewable energy resources; Semiconductor device packaging; Semiconductor materials; Solar power generation;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
ISSN
1060-8371
Print_ISBN
0-7803-7471-1
Type
conf
DOI
10.1109/PVSC.2002.1190879
Filename
1190879
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