• DocumentCode
    3347020
  • Title

    Commonly observed degradation in field-aged photovoltaic modules

  • Author

    Quintana, M.A. ; King, D.L. ; McMahon, T.J. ; Osterwald, C.R.

  • fYear
    2002
  • fDate
    19-24 May 2002
  • Firstpage
    1436
  • Lastpage
    1439
  • Abstract
    Degradation leading to failure in photovoltaic modules follows a progression that is dependent on multiple factors, some of which interact causing degradation that is difficult to simulate in the lab. This paper defines observed degradation in field-aged modules, including degradation of packaging materials, adhesional loss, degradation of interconnects, degradation due to moisture intrusion, and semiconductor device degradation. Additionally, this paper suggests that the onset and progression of degradation need to be studied to gain a more comprehensive understanding of module degradation rates and module failures.
  • Keywords
    adhesion; failure analysis; interconnections; moisture; packaging; semiconductor devices; solar cell arrays; adhesional loss; field-aged photovoltaic modules; interconnects degradation; module degradation rates; module failures; moisture intrusion; packaging materials; photovoltaic modules degradation; photovoltaic modules failure; semiconductor device degradation; Conducting materials; Degradation; Laboratories; Moisture; Performance loss; Photovoltaic systems; Renewable energy resources; Semiconductor device packaging; Semiconductor materials; Solar power generation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
  • ISSN
    1060-8371
  • Print_ISBN
    0-7803-7471-1
  • Type

    conf

  • DOI
    10.1109/PVSC.2002.1190879
  • Filename
    1190879