Title :
Reducing the measurement footprint in the characterization of low-loss materials using the flanged-waveguide measurement geometry
Author :
Hyde, M.W., IV ; Havrilla, M.J.
Author_Institution :
Dept. of Electr. & Comput. Eng., Air Force Inst. of Technol., Dayton, OH, USA
Abstract :
The purpose of this paper is to demonstrate how the flanged-waveguide material-characterization technique, originally designed to characterize lossy materials only, can be extended to accurately extract permittivity and permeability of low-loss materials. Provided in this paper is a summary of the flanged-waveguide technique. This is followed by a discussion of how time-domain gating can be utilized to mitigate the error introduced by waves reflected from the edges of the flanges. Furthermore, it is demonstrated that by utilizing time-domain gating, the cross-sectional dimensions of the flanges can be significantly reduced. Lastly, material measurement results of plexiglass are provided to validate the time-domain gating technique.
Keywords :
flanges; magnetic permeability measurement; permittivity measurement; rectangular waveguides; time-domain analysis; cross-sectional dimension; flanged-waveguide material characterization; flanged-waveguide measurement geometry; low-loss material permeability; low-loss material permittivity; measurement footprint; plexiglass; time-domain gating; Book reviews; Logic gates; Materials; Permeability; Permittivity; Permittivity measurement; Time domain analysis;
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-7366-3
DOI :
10.1109/ICEAA.2010.5652258