Title :
Modal and impact analysis of modern portable electronic products
Author :
Tan, L.B. ; Ang, C.W. ; Lim, C.T. ; Tan, V.B.C. ; Zhang, Xiaowu
Author_Institution :
Dept. of Mech. Eng., Nat. Univ. of Singapore, Kent Ridge, Singapore
fDate :
31 May-3 June 2005
Abstract :
Drop impact responses of various modern cell-phones and portable digital assistants (PDAs) are analyzed in terms of the impact forces and accelerations and strains induced on the printed circuit boards (PCBs). The severity of impact induced on the interior PCBs and their electronic components can be determined from product-level drop tests. The results complement board level tests designed to simulate actual drop conditions experienced by PCBs within the portable products. This paper reports impact performances of recent portable products such as handphones from Samsung, Panasonic and Nokia as well as PDAs from Compaq and Sony. This is a continuation of the research done by Lim et al, 2003.
Keywords :
consumer electronics; impact testing; life testing; modal analysis; printed circuit testing; drop impact response; impact analysis; impact forces; modal analysis; portable electronic products; printed circuit boards; strains; Acceleration; Accelerometers; Cameras; Capacitive sensors; Circuit testing; Electronic components; Electronic equipment testing; Integrated circuit packaging; Personal digital assistants; Transducers;
Conference_Titel :
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Print_ISBN :
0-7803-8907-7
DOI :
10.1109/ECTC.2005.1441337
