DocumentCode :
3347263
Title :
Scattering by implants during MRI: A simplified computational approach
Author :
Mohsin, S.A. ; Sheikh, N.M.
Author_Institution :
Dept. of Electr. Eng., Univ. of Eng. & Technol., Lahore, Pakistan
fYear :
2010
fDate :
20-24 Sept. 2010
Firstpage :
517
Lastpage :
520
Abstract :
During magnetic resonance imaging (MRI), an implanted lead present in a patient´s body scatters the radiofrquency (RF) field used for magnetic resonance. The resultant RF field can achieve very high values in the vicinity of the implant structure. The conduction currents flowing in tissue can cause dangerous resistive heating. Therefore scattering by implanted devices is an important safety issue in MR scanning. The scattering problem is large and computationally expensive. However the scattered field produced by the implant has a significant strength only in the vicinity of the implant and does not extend over a large tissue volume. Using this fact, a hybrid finite element-method of moments (FEM-MoM) formulation is used in this paper to compute the scattered fields of different implants.
Keywords :
biological effects of radiation; biomedical MRI; electric current; electromagnetic wave scattering; finite element analysis; heating; method of moments; prosthetics; FEM-MoM formulation; biological tissue; biomedical MRI; conduction currents; hybrid finite element-method of moments; implant scattering; magnetic resonance imaging; radiofrquency scattering; resistive heating; resultant RF field; Electric fields; Finite element methods; Heating; Implants; Magnetic resonance imaging; Moment methods; Radio frequency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetics in Advanced Applications (ICEAA), 2010 International Conference on
Conference_Location :
Sydney, NSW
Print_ISBN :
978-1-4244-7366-3
Type :
conf
DOI :
10.1109/ICEAA.2010.5652259
Filename :
5652259
Link To Document :
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