• DocumentCode
    3347529
  • Title

    Power delivery validation of processor front side bus

  • Author

    Suryakumar, Mahadevan ; He, Jiangqi

  • Author_Institution
    Intel Corp., Chandler, AZ, USA
  • fYear
    2005
  • fDate
    31 May-3 June 2005
  • Firstpage
    746
  • Abstract
    With lower I/O operating voltage and decreasing noise margin targets, it is imperative that the amount of noise generated on the voltage rails is kept within tight tolerances for high speed signaling. For this a good understanding of the behavioral model of the package and on-die passives is required in addition to the on-die transients generated on the power supply network when I/O´s toggle. One of the major challenges is to accurately measure this dynamic power fluctuation (di/dt) for various I/O bit pattern excitation to understand the effectiveness of decoupling capacitors in the power distribution network. This paper discusses the power delivery validation methodology of the processor front side bus (FSB) that allows the user to input a stream of data into the I/O´s to measure the power supply noise and the resulting dynamic power fluctuation. A detailed three dimensional model of the package, motherboard was then created and simulated using Speed2K/PowerSI by Sigrity Corporation to correlate with measured results.
  • Keywords
    integrated circuit modelling; integrated circuit noise; integrated circuit packaging; microprocessor chips; power capacitors; power supply circuits; power system transients; I/O operating voltage; decoupling capacitor; dynamic power fluctuation; front side bus; noise margin target; on-die transient; power delivery; power distribution network; power supply network; Fluctuations; Noise generators; Packaging; Power generation; Power measurement; Power supplies; Power system dynamics; Rails; Signal generators; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441353
  • Filename
    1441353