• DocumentCode
    3347696
  • Title

    Tests of FPDR90 IC for hybrid detector readout for high frame rate X-ray applications

  • Author

    Szczygiel, R. ; Grybos, P. ; Maj, P.

  • Author_Institution
    Dept. of Meas. & Instrum., AGH Univ. of Sci. & Technol., Cracow, Poland
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    673
  • Lastpage
    676
  • Abstract
    We report on the high count rate and high frame rate measurements of a prototype IC called FPDR90 dedicated for readout of hybrid pixel semiconductor detectors used for X-ray imaging applications. The FPDR90 is designed in 90 nm CMOS technology and has dimensions of 4 mm × 4 mm. It´s main part is a matrix of 40 × 32 pixels with 100 μm × 100 μm pixel size. The chip work in single photon counting mode with two discriminators and two 16-bit ripple counters per pixel. The count rate per pixel depends on the effective CSA feedback resistance and can be set up to 6 Mcps per pixel. The FPDR90 can operate in continuous readout mode, with a zero dead time. Due to the architecture of digital blocks in pixel, one can select the number of readout bits from each counter from 1 to 16 bits. Because in the FPDR90 prototype only one data output is available, the frame rate is 9 kHz and 72 kHz for 16 bits and 1 bit readout from single pixel respectively (with nominal clock frequency of 200 MHz).
  • Keywords
    CMOS image sensors; X-ray detection; X-ray imaging; hybrid integrated circuits; nuclear electronics; readout electronics; semiconductor counters; 16-bit ripple counters; CMOS technology; FPDR90 IC; FPDR90 prototype; X-ray applications; X-ray imaging applications; a zero dead time; continuous readout mode; digital block architecture; frequency 72 kHz; frequency 9 kHz; high count rate; high frame rate; hybrid pixel semiconductor detectors; single photon counting mode; CMOS integrated circuits; CMOS technology; Radio access networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6154080
  • Filename
    6154080