Title :
A Tezzaron-Chartered 3D-IC electronic for SLHC/ATLAS hybrid pixels detectors test results and irradiations performance
Author :
Pangaud, P. ; Arutinov, D. ; Barbero, M. ; Breugnon, P. ; Chantepie, B. ; Clemens, J.C. ; Fei, R. ; Fougeron, D. ; Garcia-Sciveres, M. ; Godiot, S. ; Hemperek, T. ; Karagounis, M. ; Kruger, H. ; Mekkaoui, A. ; Perrot, L. ; Rozanov, A. ; Wermes, N.
Author_Institution :
Centre de Phys. des Particules de Marseille, Univ. de la Mediterranee Aix-Marseille II, Marseille, France
Abstract :
The ATLAS pixel collaboration has started in 2008 a R&D program to use the latest advances in 3-D electronics technology in order to develop a new Front-End (FE) chip for a vertex detector for High Energy Physics (HEP). This program using the commercial Tezzaron-Chartered 0.13μm LP technology should be able to fulfill the requirements imposed by the ten times higher luminosity given by the High Luminosity LHC accelerator. The FE-TC4-P1 is a hybrid pixel read-out chip realized by the first MPW for HEP. This three dimensional chip includes an analog part called FE-TC4-AE and two digital parts called FE-TC4-DS and FE-TC4-DC. At the same time, several prototypes were realized in Chartered 0.13μm LP technology, in order to disentangle from effects induced by 3D architecture. These FE-C4-P1,2,3 prototypes have proved a good radiation hardness up to 400Mrads as well as good performances. This paper presents results from the FE-TC4-P1 chip which has been recently tested and irradiated.
Keywords :
nuclear electronics; position sensitive particle detectors; readout electronics; semiconductor counters; 3-D electronics technology; 3D architecture; ATLAS pixel collaboration; FE-TC4-AE chip; FE-TC4-DC chip; FE-TC4-DS chip; LHC accelerator; SLHC-ATLAS hybrid pixels detectors; Tezzaron-Chartered 3D-IC electronic; front-end chip; high energy physics; hybrid pixel read-out chip; irradiations performance; vertex detector; Acceleration; Bonding; Context;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154082