Title : 
Investigation on the I-V characteristics of a high concentration, photovoltaic array
         
        
            Author : 
Vorster, F.J. ; van Dyk, E.E. ; Leitch, A.W.R.
         
        
            Author_Institution : 
Dept. of Math. Sci., Technikon, Port Elizabeth, South Africa
         
        
        
        
        
        
            Abstract : 
The aim of this study was to highlight the effects on the I-V characteristics of concentrator arrays due to mismatch between series-connected high concentration PV modules and between single junction cells within a module. The mismatch between cells was caused by a number of factors including: misalignment of optical elements and cells, uneven shading due to dust or delamination of the cell-secondary lens interface, degradation of the main Fresnel lens and non-uniform cell material parameters. Small amounts of mismatch that would go unnoticed at one-Sun insolation levels are vastly amplified at high concentration ratios. This paper reports on, and interprets the regular I-V measurements that were recorded over a period of two years under various conditions. The effect of bypass diodes on the module I-V curves is also investigated. The general characteristics of the measured resultant I-V curves are explained. The degradation of the PV concentrator modules over a period of two years is also confirmed from the I-V measurements.
         
        
            Keywords : 
electric current measurement; lenses; solar cell arrays; solar energy concentrators; voltage measurement; Fresnel lens; cell module mismatch; concentrator photovoltaic arrays; current voltage characteristics; high concentration photovoltaic modules; misalignment; resistive heating effect; reverse biased strings; single junction cells; uneven shading; Africa; Current measurement; Degradation; Diodes; Lenses; Optical materials; Photovoltaic systems; Solar power generation; Stimulated emission; Voltage;
         
        
        
        
            Conference_Titel : 
Photovoltaic Specialists Conference, 2002. Conference Record of the Twenty-Ninth IEEE
         
        
        
            Print_ISBN : 
0-7803-7471-1
         
        
        
            DOI : 
10.1109/PVSC.2002.1190922