Title : 
A radiation-tolerant 5 Gb/s Laser Driver in CMOS 130 nm technology
         
        
            Author : 
Mazza, Giovanni ; Gui, Ping ; Moreira, Paulo ; Rivetti, Angelo ; Soos, Csaba ; Troska, Jan ; Wyllie, Ken
         
        
            Author_Institution : 
Ist. Naz. di Fis. Nucleare, Sezione di Torino, Torino, Italy
         
        
        
        
        
        
            Abstract : 
The GigaBit Laser Driver (GBLD) is a radiation tolerant ASIC designed to drive both edge emitting lasers and VCSELs at data rates up to 5 Gb/s. It is part of the GigaBit Transceiver (GBT) project, which aims at the design of an optical transceiver capable to operate in the radiation environment of a typical HEP experiment. The GBLD can provide a modulation current of up to 24 mA and a laser bias current of up to 43 mA. Pre- and deemphasis functions are implemented to compensate for high external capacitive loads and asymmetric laser response. The chip, designed in CMOS 130 nm technology, is powered by a single 2.5 V power supply can be programmed via an I2C interface.
         
        
            Keywords : 
CMOS integrated circuits; application specific integrated circuits; semiconductor counters; CMOS technology; GigaBit laser driver; GigaBit transceiver; asymmetric laser response; current 24 mA; current 43 mA; de-emphasis function; driver circuits; high external capacitive loads; high speed integrated circuits; laser bias current; modulation current; optical transceiver; power supply; pre-emphasis function; radiation environment; radiation hardening; radiation tolerant ASIC; radiation-tolerant laser driver; size 130 nm; typical HEP experiment; Annealing; CMOS integrated circuits; CMOS technology; Modulation; Scattering; Driver circuits; High speed integrated circuits; Radiation hardening;
         
        
        
        
            Conference_Titel : 
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
         
        
            Conference_Location : 
Valencia
         
        
        
            Print_ISBN : 
978-1-4673-0118-3
         
        
        
            DOI : 
10.1109/NSSMIC.2011.6154087