Coherent scattering for efficient near field microscopy

Author

Averbukh, I.S. ; Chernobrod, B.M. ; Prior, Y.

Author_Institution

Dept. of Chem. Phys., Weizmann Inst. of Sci., Rehovot, Israel

fYear

1992

fDate

23-28 May 1992

Firstpage

118

Abstract

Summary form only given. A large class of near-field optical microscopes employ tapered Al coated single mode optical fibers which form a subwavelength aperture at their ends. Better spatial resolution had been achieved at IBM by an apertureless scheme in which a sharp nanosize probe of an AFM device was externally illuminated and the amplitude of the scattered light was interferometrically measured in the far-field zone.

Keywords

light coherence; light interferometry; light scattering; optical microscopes; AFM device; IBM; apertureless scheme; coherent scattering; efficient near field microscopy; externally illuminated; far-field zone; harp nanosize probe; interferometrically measured; light interferometry; near-field optical microscopes; scattered light amplitude measurement; spatial resolution; subwavelength aperture; tapered Al coated single mode optical fibers; Apertures; Atomic force microscopy; Light scattering; Nanoscale devices; Optical fibers; Optical interferometry; Optical microscopy; Optical scattering; Probes; Spatial resolution;

fLanguage

English

Publisher

ieee

Conference_Titel

Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the

Conference_Location

Baltimore, MD, USA

Print_ISBN

1-55752-576-X

Type

conf

DOI

10.1109/QELS.1999.807391

Filename

807391