Title :
Coherent scattering for efficient near field microscopy
Author :
Averbukh, I.S. ; Chernobrod, B.M. ; Prior, Y.
Author_Institution :
Dept. of Chem. Phys., Weizmann Inst. of Sci., Rehovot, Israel
Abstract :
Summary form only given. A large class of near-field optical microscopes employ tapered Al coated single mode optical fibers which form a subwavelength aperture at their ends. Better spatial resolution had been achieved at IBM by an apertureless scheme in which a sharp nanosize probe of an AFM device was externally illuminated and the amplitude of the scattered light was interferometrically measured in the far-field zone.
Keywords :
light coherence; light interferometry; light scattering; optical microscopes; AFM device; IBM; apertureless scheme; coherent scattering; efficient near field microscopy; externally illuminated; far-field zone; harp nanosize probe; interferometrically measured; light interferometry; near-field optical microscopes; scattered light amplitude measurement; spatial resolution; subwavelength aperture; tapered Al coated single mode optical fibers; Apertures; Atomic force microscopy; Light scattering; Nanoscale devices; Optical fibers; Optical interferometry; Optical microscopy; Optical scattering; Probes; Spatial resolution;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807391
