DocumentCode
3347949
Title
AGET, the GET front-end ASIC, for the readout of the Time Projection Chambers used in nuclear physic experiments
Author
Anvar, S. ; Baron, P. ; Blank, B. ; Chavas, J. ; Delagnes, E. ; Druillole, F. ; Hellmuth, P. ; Nalpas, L. ; Pedroza, J.L. ; Pibernat, J. ; Pollacco, E. ; Rebii, A. ; Usher, N.
Author_Institution
DSM/IRFU, CEA Saclay, Gif-sur-Yvette, France
fYear
2011
fDate
23-29 Oct. 2011
Firstpage
745
Lastpage
749
Abstract
Today with the advent of intense radioactive beams, we have access to nuclear spectroscopy and reaction studies of nuclei far from stability. It has been demonstrated that Time Projection Chambers (TPC) method can be very effective as an active target for such studies yielding low thresholds, efficiency and luminosity [1]. To this end a Generic Electronic system for TPCs (GET) is in development and will cover small to medium sized instrumentation (64 to 32 k channels) with a relatively wide charge dynamic ranges for event rates of up to 1 kHz. The 64-channel AGET (ASIC for GET) front-end circuit has been developed to perform the amplification, detection and analog storage of the shaped detector signal before its digitization by an external 12-bit ADC. This design offers a large flexibility in sampling frequency (100 MHz max.), peaking time (16 values from 50 ns to 1 μs), gain (4 ranges from 120 fC to 10 pC per channel) and signal polarity (negative or positive). Fabricated using 0.35 μm CMOS technology, the AGET prototype is under test and the first results are presented.
Keywords
application specific integrated circuits; nuclear electronics; readout electronics; time projection chambers; AGET; CMOS technology; Generic Electronic system for TPCs; Time Projection Chamber; efficiency; front end ASIC; luminosity; nuclear physic experiments; nuclear spectroscopy; radioactive beams; readout; time 50 ns to 1 mus; CMOS integrated circuits; CMOS technology; Capacitors;
fLanguage
English
Publisher
ieee
Conference_Titel
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location
Valencia
ISSN
1082-3654
Print_ISBN
978-1-4673-0118-3
Type
conf
DOI
10.1109/NSSMIC.2011.6154095
Filename
6154095
Link To Document