DocumentCode
3348183
Title
Determination of Components Candidacy for Second Side Reflow with Lead-Free Solder
Author
Liu, Yueli ; Geiger, David A. ; Shangguan, Dongkai
Author_Institution
Flextronics, San Jose, CA
fYear
2005
fDate
May 31 2005-June 3 2005
Firstpage
970
Lastpage
976
Abstract
For double-sided assemblies, the solder joints on the topside of the board are inverted and reflowed again. During the second reflow, the components are held in place by the surface tension, which may prevent the components from falling off under the gravitational force. A method is needed to determine a component´s candidacy for bottom-side attachment based on the component weight and total pad area. In this paper, a theoretical model was introduced to determine the critical value for component fall-off during the second reflow. Design of experiments (DOE) and ANOVA analysis for lead-free solder boards were performed to examine the main process factors which have different effects on the component fall-off for different components, and comparison was made between lead-free and SnPb solders. Optical inspection and cross-sectioning were carried out for further investigation. The test results indicated no significant difference of Cg/Pa value between SnPb and lead-free solders
Keywords
assembling; automatic optical inspection; design of experiments; printed circuit manufacture; reflow soldering; solders; surface tension; ANOVA analysis; SnPb solders; bottom-side attachment; component candidacy; component fall-off; component weight; design of experiments; double-sided assemblies; gravitational force; lead-free solder boards; optical inspection; second side reflow; solder joints; surface tension; total pad area; Analysis of variance; Assembly; Environmentally friendly manufacturing techniques; Gravity; Lead; Performance analysis; Semiconductor device modeling; Soldering; Surface tension; US Department of Energy;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2005. Proceedings. 55th
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
0-7803-8907-7
Type
conf
DOI
10.1109/ECTC.2005.1441389
Filename
1441389
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