• DocumentCode
    3348319
  • Title

    Thermal simulation for predicting substrate temperature during reflow soldering process

  • Author

    Inoue, Michinobu ; Koyanagawa, Takashi

  • Author_Institution
    Corporate Manuf. Eng. Center, Toshiba Corp., Yokohama, Japan
  • fYear
    2005
  • fDate
    31 May-3 June 2005
  • Firstpage
    1021
  • Abstract
    Widespread use of lead-free solders requires precise control of the temperature on a substrate during reflow soldering, because the margin between the higher melting temperatures of lead-free solders and the heat-resistant temperatures of electronic components becomes narrow. For this purpose, the thermal simulation method has been developed for predicting the temperature on a substrate and optimizing the temperature profile during the reflow soldering process. Most reflow furnaces have two heating systems: forced convection by hot gas and radiation by infrared rays. Heat transfer by convection can be calculated with the experimental equation for multiple impinging jets without any fluid analysis. Heat transfer by radiation was calculated with a mechanical solver, taking into account the shape factor between the moving substrate on a conveyer and the heater. The predicted temperatures obtained by the simulation method showed good agreement with measured temperatures using a test substrate. Then, this simulation method was applied to mobile phone substrate in order to optimize the reflow process.
  • Keywords
    forced convection; heat transfer; reflow soldering; solders; thermal analysis; electronic components; fluid analysis; forced convection; heat transfer; heat-resistant temperatures; hot gas; infrared rays; lead-free solders; mechanical solver; mobile phone substrate; multiple impinging jets; reflow furnaces; reflow soldering process; substrate temperature prediction; thermal simulation; Electronic components; Environmentally friendly manufacturing techniques; Heat transfer; Infrared heating; Lead; Optimization methods; Predictive models; Reflow soldering; Temperature control; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441396
  • Filename
    1441396