An operational method of correction for atmospheric and scan angle effects

Author

Che, N. ; Doraiswamy, P.C. ; Xia, W.

Author_Institution

Swales & Assoc. Inc., Beltsville, MD, USA

Volume

3

fYear

34881

fDate

10-14 Jul1995

Firstpage

1955

Abstract

An operational procedure for correcting the visible and near infrared reflectances of NOAA AVHRR data was developed. Correction for atmospheric effects is based on the estimation of two main parameters: aerosol optical depth (AOD) and the total water vapor content of the atmosphere, that are referenced to ground based surface meteorological data. An error of ±0.02 of NDVI (Normalized Difference Vegetation Index) is expected due to the uncertainty of AOD. Scan angle effects due to the bidirectional reflectance distribution function (BRDF) for a designated area in Iowa is assessed by scanning pixels across a predominantly agricultural area with uniformly growing crops. The research demonstrates the characteristics that are critical to anisotropic reflection. A maximum error of 10% in NDVI is estimated after correcting the data for atmospheric and scan angle effects

Keywords

atmospheric light propagation; atmospheric optics; geophysical techniques; light propagation; meteorology; remote sensing; tropospheric electromagnetic wave propagation; BRDF; NDVI; NOAA AVHRR; Normalized Difference Vegetation Index; aerosol optical depth; agricultural area; anisotropic reflection; atmospheric optics; bidirectional reflectance distribution function; geophysical measurement technique; growing crop; land surface; light propagation; operational method; optical correction; optical imaging; scan angle effect; terrain mapping; total water vapor content; vegetation mapping; visible IR infrared; Aerosols; Anisotropic magnetoresistance; Atmosphere; Bidirectional control; Crops; Distribution functions; Meteorology; Optical reflection; Uncertainty; Vegetation;

fLanguage

English

Publisher

ieee

Conference_Titel

Geoscience and Remote Sensing Symposium, 1995. IGARSS '95. 'Quantitative Remote Sensing for Science and Applications', International

Conference_Location

Firenze

Print_ISBN

0-7803-2567-2

Type

conf

DOI

10.1109/IGARSS.1995.524077

Filename

524077