• DocumentCode
    3348607
  • Title

    Sensor fault detection and isolation using phase space reconstruction

  • Author

    Cheng-Ken Yang ; Alemi, Alireza ; Langari, Reza

  • Author_Institution
    Texas A&M Univ., College Station, TX, USA
  • fYear
    2015
  • fDate
    1-3 July 2015
  • Firstpage
    892
  • Lastpage
    899
  • Abstract
    Fault diagnosis is the central component of abnormal event management (AEM) [1-3]. Because of the increasing need for higher system performance, product quality, human safety, and cost efficiency, fault diagnosis systems are applied in diverse industrial fields, such as petrochemical and petroleum industries, robotics, and automotive/aerospace systems [4, 5]. According to the International Federation of Automatic Control (IFAC), a fault is defined as an unpermitted deviation of at least one characteristic property or parameter of the system from the acceptable/usual/standard condition [6-8]. If the unpermitted deviation grows worse with time, a fault may result in abnormal events or accidents. This paper is focused in the direction of sensor faults to provide a novel method to detect and isolate multiple sensor faults. This paper is organized as follows. A comprehensive problem statement and literature review is given in the next two Sections. After that, an overview of phase space reconstruction is introduced, and the proposed method and its simulation results are presented. Conclusion is given in the last Section.
  • Keywords
    fault diagnosis; phase space methods; AEM; IFAC; International Federation of Automatic Control; abnormal event management; cost efficiency; fault diagnosis system; human safety; phase space reconstruction; product quality; sensor fault detection and isolation; system performance; unpermitted deviation; Delay effects; Fault detection; Fault diagnosis; Fluctuations; Noise; Temperature sensors; Trajectory;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    American Control Conference (ACC), 2015
  • Conference_Location
    Chicago, IL
  • Print_ISBN
    978-1-4799-8685-9
  • Type

    conf

  • DOI
    10.1109/ACC.2015.7170847
  • Filename
    7170847