Laser based sub-picosecond electron bunch characterization using 90° Thomson scattering

Author

Leemans, W.P. ; Volfbeyn, P. ; Zolotorev, M. ; Kim, K.-J. ; Chattopadhyay, S. ; Schoenlein, R.W. ; Chin, A.H. ; Glover, T.E. ; Balling, P. ; Shank, C.V.

Author_Institution

Lawrence Berkeley Lab., CA, USA

Volume

2

fYear

1997

fDate

12-16 May 1997

Firstpage

1984

Abstract

X-rays produced by 90° Thomson scattering of a femtosecond, near infrared, terawatt laser pulse off a 50 MeV electron beam are shown to be an effective diagnostic to measure transverse and longitudinal density distributions of an electron beam (e-beam) with subpicosecond time resolution. The laser beam was focused onto the e-beam waist, generating 30 keV X-rays in the forward direction. The transverse and longitudinal e-beam structure have been obtained by measuring the intensity of the X-ray beam, while scanning the laser beam across the e-beam in space and time. The e-beam divergence has been obtained through measurement of spatial and spectral characteristics of the scattered X-ray beam

Keywords

X-ray detection; electron beams; light scattering; measurement by laser beam; particle beam bunching; particle beam diagnostics; 1 TW; 30 keV; Thomson scattering; X-rays; divergence; electron beam; electron bunch; femtosecond; laser pulse; longitudinal density distribution; near infrared; transverse density distribution; Charge-coupled image sensors; Electron beams; Laser beams; Light scattering; Optical pulses; Optical scattering; Particle beams; Pulse measurements; X-ray lasers; X-ray scattering;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1997. Proceedings of the 1997

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-4376-X

Type

conf

DOI

10.1109/PAC.1997.751081

Filename

751081