DocumentCode
3349099
Title
Nanostructured VO2 film coatings for tunable MEMS resonators
Author
Merced, Emmanuelle ; Cabrera, Rafmag ; Suarez, Ramón ; Fernández, Félix E. ; Sepúlveda, Nelson
Author_Institution
Electr. & Comput. Eng. Dept., Univ. of Puerto Rico, Mayaguez, PR, USA
fYear
2010
fDate
12-15 Oct. 2010
Firstpage
212
Lastpage
215
Abstract
This paper reports measurements of the electrical resistance and resonant frequency of VO2-coated silicon dioxide (SiO2) bridges when the coating´s insulator-to-metal transition (IMT) is thermally induced by conduction. The measurements of these two properties were done simultaneously. The decrease in electrical resistance was close to three orders in magnitude. The resonant frequency shift across the IMT started with an increase of 1.5% for temperatures in the “cold end” of the IMT, followed by a decrease of 20% for temperatures in the “hot end” of the IMT.
Keywords
electrical resistivity; frequency measurement; metal-insulator transition; micromechanical resonators; nanostructured materials; silicon compounds; thin films; vanadium compounds; VO2-SiO2; electrical resistance measurements; insulator-to-metal transition; nanostructured film coatings; resonant frequency measurements; tunable MEMS resonators; Bridges; Films; Frequency measurement; Micromechanical devices; Resistance; Resonant frequency; Temperature measurement;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
Conference_Location
Monterey, CA
Print_ISBN
978-1-4244-8896-4
Type
conf
DOI
10.1109/NMDC.2010.5652371
Filename
5652371
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