• DocumentCode
    3349099
  • Title

    Nanostructured VO2 film coatings for tunable MEMS resonators

  • Author

    Merced, Emmanuelle ; Cabrera, Rafmag ; Suarez, Ramón ; Fernández, Félix E. ; Sepúlveda, Nelson

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Puerto Rico, Mayaguez, PR, USA
  • fYear
    2010
  • fDate
    12-15 Oct. 2010
  • Firstpage
    212
  • Lastpage
    215
  • Abstract
    This paper reports measurements of the electrical resistance and resonant frequency of VO2-coated silicon dioxide (SiO2) bridges when the coating´s insulator-to-metal transition (IMT) is thermally induced by conduction. The measurements of these two properties were done simultaneously. The decrease in electrical resistance was close to three orders in magnitude. The resonant frequency shift across the IMT started with an increase of 1.5% for temperatures in the “cold end” of the IMT, followed by a decrease of 20% for temperatures in the “hot end” of the IMT.
  • Keywords
    electrical resistivity; frequency measurement; metal-insulator transition; micromechanical resonators; nanostructured materials; silicon compounds; thin films; vanadium compounds; VO2-SiO2; electrical resistance measurements; insulator-to-metal transition; nanostructured film coatings; resonant frequency measurements; tunable MEMS resonators; Bridges; Films; Frequency measurement; Micromechanical devices; Resistance; Resonant frequency; Temperature measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    978-1-4244-8896-4
  • Type

    conf

  • DOI
    10.1109/NMDC.2010.5652371
  • Filename
    5652371