• DocumentCode
    3349311
  • Title

    A New Via Hole Structure of MLB (Multi-Layered Printed Circuit Board) for RF and High Speed Systems

  • Author

    Kim, Young-Woo ; Kim, Jin-Ho ; Yang, Hae-Wook ; Kwon, Oh-Kyong ; Ryu, Carl ; Min, Byoung-Yul

  • Author_Institution
    Div. of Electr. & Comput. Eng., Hanyang Univ., Seoul
  • fYear
    2005
  • fDate
    May 31 2005-June 3 2005
  • Firstpage
    1378
  • Lastpage
    1382
  • Abstract
    We propose a new via hole structure that reduces the amount of reflection noise of RF and high speed digital signals in multilayered PCB (printed circuit boards) and compare the electrical characteristics of the proposed via hole with them of conventional vias such as stacked, staggered and through via types. To verify the performance, after extracting RLC (resistance-inductance-capacitance) parameter from the actual structure, II-type equivalent lumped-circuit model including interaction between power and ground planes is established and the deviation of transmission properties for each type is analyzed through S-parameter and eye-diagram. At 5GHz, the reflection noise of the proposed via structure can be 2.3-3.8 times smaller than that of conventional ones. ISI (intersymbol interference) is reduced less than 5ps and TOF (time of flight) is 77ps shorter than any other types. It improves the output voltage efficiency 15-30% and extends the bandwidth 1.5-2 times. The effective density to layout the trace around it can be increased because of shielding signal via holes
  • Keywords
    S-parameters; circuit noise; equivalent circuits; lumped parameter networks; printed circuit design; 5 GHz; RLC parameter; S-parameter; digital signal; equivalent lumped-circuit model; eye diagram; high speed system; intersymbol interference; multilayered printed circuit board; output voltage efficiency; reflection noise reduction; via hole structure; Acoustic reflection; Circuit noise; Electric variables; Intersymbol interference; Noise reduction; Performance analysis; Printed circuits; RF signals; Radio frequency; Scattering parameters;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2005. Proceedings. 55th
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-8907-7
  • Type

    conf

  • DOI
    10.1109/ECTC.2005.1441449
  • Filename
    1441449