Title :
Electronic System Level Models for Functional Verification of System-on-Chip
Author :
Adamov, Alexander ; Mostovaya, Karina ; Syzonenko, Inna ; Melnik, Alexey
Author_Institution :
Dept. of DAD, Kharkov Nat. Univ. of Radio Electron., Kharkov
Abstract :
Modern verification environments based on object-oriented methodology is a system-level solution that manages the process and data for a particular system-on-chip model. These systems give an ability to integrate smaller blocks of design into larger blocks, which may eventually be integrated into a system. That is reason for performing designing and functional verification at a system level, which allow teams to rapidly create large system-on-chip designs by integrating premade blocks. Integrated verification systems used to store and manage huge amount of simulation data. However, when the amount of data is large, it is difficult to analyze and extract information from it. This data can be archived for later use or it can be mined to look for different kind of violations or to get statistical information about the specified design. The paper describes the system-level verification environment for a functional verification system-on-chip models. With the help of novel approach we can easily use opportunities, that system-level modeling gives us, such as: early software validation of the system, performance analysis of the system, transaction-level verification of the project, architectural analysis of system-on-chip (SoC) , power analysis of a chip, searching hardware/software tradeoffs.
Keywords :
data mining; electronic design automation; embedded systems; formal verification; integrated circuit design; integrated circuit modelling; integrated circuit testing; object-oriented methods; statistical analysis; system-on-chip; SoC architectural analysis; chip power analysis; data mining; designing aspects; electronic system level models; embedded system design; formal verification; functional verification system-on-chip model; hardware/software tradeoffs search; integrated verification systems; knowledge discovery; object-oriented methodology; software validation; statistical information; system performance analysis; system-level verification environment; transaction-level verification; Data mining; Hardware; Object oriented modeling; Performance analysis; Power system modeling; Process design; Software performance; Software prototyping; System-on-a-chip; Virtual prototyping; System-on-Chip; Verification; data mining; knowledge discovery; system level modeling;
Conference_Titel :
CAD Systems in Microelectronics, 2007. CADSM '07. 9th International Conference - The Experience of Designing and Applications of
Conference_Location :
Lviv-Polyana
Print_ISBN :
966-533-587-0
DOI :
10.1109/CADSM.2007.4297576