Title :
Ellipsoidal Tolerances Analysis Ensuring Product Yield Probability
Author_Institution :
Zaporizhzhya Nat. Tech. Univ., Zaporizhzhya
Abstract :
A method of probabilistic tolerances analysis under normal distribution of input parameters and given product yield probability is offered. Output function deviations are found in points of its minimal and maximal values in bounds of tolerances domain, which approximated by multidimensional ellipsoid. Its size is selected proportionally to normalized normal inverse distribution.
Keywords :
integrated circuit layout; normal distribution; tolerance analysis; ellipsoidal tolerances analysis; multidimensional ellipsoid; normal inverse distribution; product yield probability; tolerances domain; Axles; Cost function; Ellipsoids; Frequency estimation; Gaussian distribution; Integral equations; Moment methods; Multidimensional systems; Tellurium; Yield estimation; Ellipsoid; Inverse Distribution; Normal Distribution; Product Yield; Tolerances Analysis;
Conference_Titel :
CAD Systems in Microelectronics, 2007. CADSM '07. 9th International Conference - The Experience of Designing and Applications of
Conference_Location :
Lviv-Polyana
Print_ISBN :
966-533-587-0
DOI :
10.1109/CADSM.2007.4297577
