A scanning target profile monitor for the slow extracted beam at the AGS

Author

Brown, K.A. ; Chiang, I-H ; Gassner, D. ; Geller, J. ; Glenn, J.W. ; Hock, J. ; Smith, G.A. ; Tuozzolo, J. ; Witkover, R. ; Zitvogel, E.

Author_Institution

Brookhaven Nat. Lab., Upton, NY, USA

Volume

2

fYear

1997

fDate

12-16 May 1997

Firstpage

2149

Abstract

The purpose of this new instrument is for probing beam halo and obtaining beam profiles of the resonant extracted beam at the AGS. The device described is a prototype version, to obtain data and prepare for a more permanent device. The goals of the permanent device are to allow emittances of low current, but high intensity slowly extracted beams to be accurately measured and to have a diagnostic for probing the wings of the beam distribution. The device works on secondary emission from thin targets as well as scattering into two scintillator telescopes. The targets are movable over the entire aperture at the device

Keywords

particle beam diagnostics; proton accelerators; storage rings; AGS; beam halo; beam profiles; emittance; scanning target profile monitor; secondary emission; slow extracted beam; Data mining; Gaussian processes; Instruments; Laboratories; Monitoring; Phase measurement; Photomultipliers; Resonance; Telescopes; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Particle Accelerator Conference, 1997. Proceedings of the 1997

Conference_Location

Vancouver, BC

Print_ISBN

0-7803-4376-X

Type

conf

DOI

10.1109/PAC.1997.751137

Filename

751137