Title :
Embedded test structures reduce ASIC time-to-market
Author :
Sobczak, David M.
Author_Institution :
LSI Logic Corp., Waltham, MA, USA
Abstract :
LSI Logic Corporation, using embedded test circuitry developed by CrossCheck Technology Inc., has developed a new compacted array technology known as the LFT150K FasTest Array series. The author gives a brief overview of the LFT150K family, describe the performance impact of the embedded test structures, compare this test scheme with conventional scan methods, and describe the FasTest time-to-market and time-to-volume advantages
Keywords :
CMOS integrated circuits; application specific integrated circuits; built-in self test; integrated circuit testing; logic arrays; logic testing; ASIC; CrossCheck Technology; LFT150K FasTest Array series; LSI Logic Corporation; compacted array technology; embedded test circuitry; embedded test structures; Application specific integrated circuits; Circuit faults; Circuit testing; Electronic equipment testing; Large scale integration; Logic arrays; Logic circuits; Logic testing; Probes; Time to market;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242844
