DocumentCode
334956
Title
Fermilab Main Ring ion profile monitor system
Author
Zagel, J.R. ; Crisp, J.L. ; Halm, A.A. ; Hurh, P.G.
Author_Institution
Fermi Nat. Accel. Lab., Batavia, IL, USA
Volume
2
fYear
1997
fDate
12-16 May 1997
Firstpage
2166
Abstract
An ion profile monitor system is now in operation in the Fermilab Main Ring. This system captures up to 64 K samples of both horizontal and vertical profiles in the Main Ring at a turn by turn sample rate. The hardware and software of the system is described. Some early results are presented
Keywords
particle beam diagnostics; proton accelerators; synchrotrons; Fermilab Main Ring; horizontal profiles; ion profile monitor system; vertical profiles; Anodes; Communication system control; Control systems; Instruments; Monitoring; Particle beams; Particle production; Printed circuits; Strips; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-4376-X
Type
conf
DOI
10.1109/PAC.1997.751143
Filename
751143
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