Grid Connected PV Systems: A Reliability-Based Comparison

Author

Chan, Freddy ; Calleja, Hugo ; Martínez, Enrique

Author_Institution

Quintana Roo Univ.

Volume

2

fYear

2006

fDate

9-13 July 2006

Firstpage

1583

Lastpage

1588

Abstract

This paper presents the reliability prediction of four photovoltaic systems: a two-stages system, a three-stages one, and two integrated topologies, one with a boost-inverter, and the second with a buck-boost inverter. The goal is to identify the most failure prone components, and the stress factors with the highest contribution to the failure rate. In all cases, it was found that the MOSFETs are the most vulnerable components, and that the dominant stress factor is related to the temperature. It was also found that the reliability can be improved if the switching devices are overrated, but only to a certain level, and using too large MOSFET can be counterproductive

Keywords

failure analysis; invertors; photovoltaic power systems; power MOSFET; power generation reliability; MOSFET; boost-inverter; buck-boost inverter; dominant stress factor; failure prone components; grid connected PV systems; photovoltaic systems; reliability prediction; reliability-based comparison; switching devices; Capacitors; Circuit topology; Guidelines; Inverters; MOSFETs; Manufacturing; Photovoltaic systems; Power system reliability; Temperature; Thermal stresses;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics, 2006 IEEE International Symposium on

Conference_Location

Montreal, Que.

Print_ISBN

1-4244-0496-7

Electronic_ISBN

1-4244-0497-5

Type

conf

DOI

10.1109/ISIE.2006.295708

Filename

4078323