• DocumentCode
    3349606
  • Title

    FISTEM: a CAD tool for synthesis of easily testable FSM

  • Author

    Prakash, B. ; Hasan, M.M.

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Kanpur, India
  • fYear
    1991
  • fDate
    23-27 Sep 1991
  • Lastpage
    38108
  • Abstract
    In this paper the authors propose a new system named FISTEM for testability synthesis and test generation of PLA-based finite state machines. A nonscan design methodology, based on constrained state assignment and logic optimization, is used which guarantees testability for all combinationally irredundant crosspoint faults in the PLA. Test sequences for these faults are obtained using combinational test generation techniques alone. An exact algorithm is used for this to obtain maximum fault coverage. For different state machines considered, the system works very efficiently to produce an optimized easily testable PLA-based logic implementation with small overhead in area
  • Keywords
    design for testability; finite state machines; logic CAD; logic arrays; logic testing; CAD tool; FISTEM; PLA-based logic; combinational test generation; constrained state assignment; crosspoint faults; finite state machines; logic optimization; maximum fault coverage; nonscan design methodology; test generation; testability synthesis; testable FSM; Automata; Automatic testing; Constraint optimization; Design automation; Encoding; Logic design; Logic testing; Programmable logic arrays; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0101-3
  • Type

    conf

  • DOI
    10.1109/ASIC.1991.242851
  • Filename
    242851