DocumentCode
334983
Title
Space charge effect in secondary electron monitors
Author
Tron, A. ; Merinov, I.
Author_Institution
MEPhI, Moscow, Russia
Volume
2
fYear
1997
fDate
12-16 May 1997
Firstpage
2247
Abstract
Phase or spatial resolution of secondary electron monitors for, respectively, longitudinal or transverse bunch charge distribution measurements are restricted by the space charge effect of both a primary beam and secondary electron one. Simulation results of the effect in the monitors in an approach of ellipsoidal bunches of the primary beam with uniform charge density and taking into account the field of charges induced by the beam will be presented
Keywords
electron accelerators; particle beam bunching; particle beam diagnostics; secondary electron emission; space charge; electron accelerators; ellipsoidal bunches; longitudinal bunch charge distribution; secondary electron monitors; space charge effect; transverse bunch charge distribution; uniform charge density; Charge measurement; Current measurement; Density measurement; Electron beams; Electron emission; Geometry; Ion beams; Linear particle accelerator; Particle beams; Space charge;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 1997. Proceedings of the 1997
Conference_Location
Vancouver, BC
Print_ISBN
0-7803-4376-X
Type
conf
DOI
10.1109/PAC.1997.751171
Filename
751171
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