DocumentCode :
3350157
Title :
Effect of UV irradiation on gas sensing behavior of nanocrystalline ZnO thin films
Author :
Soleimanpour, A.M. ; Jayatissa, A.H.
Author_Institution :
Ind. & Manuf. Eng. Dept., Univ. of Toledo, Toledo, OH, USA
fYear :
2010
fDate :
12-15 Oct. 2010
Firstpage :
225
Lastpage :
229
Abstract :
The effect of UV irradiation on ZnO thin film based gas sensor was investigated. Zinc oxide thin films were deposited on an alkali free glass substrate by magnetron sputtering system using zinc target. The UV irradiation of the ZnO thin films was measured to understand the change of microstructure, electrical properties, optical properties and gas sensing characteristics. The X-ray diffraction patterns and SEM images revealed that the films have a nanocrystalline structure. The optical properties of ZnO films were not affected by the UV irradiation significantly. The gas sensing behavior of zinc oxide thin films were enhanced by UV irradiation for a shorter period whereas sensing characteristics were degraded for a longer irradiation period. It was also observed that the dependence of gas sensing characteristics was correlated with the change of electrical properties and crystallinity of films.
Keywords :
II-VI semiconductors; X-ray diffraction; gas sensors; nanostructured materials; scanning electron microscopy; semiconductor thin films; sputter deposition; thin film sensors; ultraviolet radiation effects; wide band gap semiconductors; zinc compounds; SEM image; SiO2; UV irradiation; X-ray diffraction pattern; ZnO; alkali free glass substrate; gas sensor; magnetron sputtering; nanocrystalline zinc oxide thin film; zinc target; Films; Gas detectors; Radiation effects; Temperature measurement; Temperature sensors; Zinc oxide; UV irradiation; XRD; Zinc oxide; gas sensing; gas sensor; sputtering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology Materials and Devices Conference (NMDC), 2010 IEEE
Conference_Location :
Monterey, CA
Print_ISBN :
978-1-4244-8896-4
Type :
conf
DOI :
10.1109/NMDC.2010.5652439
Filename :
5652439
Link To Document :
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