DocumentCode :
3350511
Title :
Computation of Parameters Pyroelectric Thin Films in the Embedded Systems
Author :
Golovatsky, R.I.
fYear :
2007
fDate :
19-24 Feb. 2007
Firstpage :
557
Lastpage :
559
Abstract :
In this paper the technique of computation frequency dependences of threshold flows and sensitivity of pyroelectric sensor in the built - in systems is offered. The basic characteristics of pyroelectric thin film, on an example of a crystal TGS, suitable to manufacture of detectors of movement on uniform of CIMS technology also are designed, in view of her features.
Keywords :
pyroelectric detectors; pyroelectricity; thin film sensors; embedded systems; pyroelectric sensor; pyroelectric thin films; sensitivity; threshold flows; CMOS technology; Computer integrated manufacturing; Embedded computing; Embedded system; Frequency; Integrated circuit technology; Low-frequency noise; Pyroelectricity; Sensor phenomena and characterization; Transistors; CIMS Technology; Embedded systems; MEMS; TGS; pyroelectric sensor; pyroelectric thin films;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
CAD Systems in Microelectronics, 2007. CADSM '07. 9th International Conference - The Experience of Designing and Applications of
Conference_Location :
Lviv-Polyana
Print_ISBN :
966-533-587-0
Type :
conf
DOI :
10.1109/CADSM.2007.4297652
Filename :
4297652
Link To Document :
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