• DocumentCode
    3350595
  • Title

    Design considerations for Cross Check foundations and libraries

  • Author

    Fertsch, Michael T. ; Lee, Shu H. ; Rioux, James ; Sweetland, Karl B. ; Watrous, James E. ; Bompastore, Paul N.

  • Author_Institution
    Adv. Device Center, Raytheon Co., Andover, MA, USA
  • fYear
    1991
  • fDate
    23-27 Sep 1991
  • Lastpage
    38108
  • Abstract
    CrossCheck built-in test techniques require special structures in Sea-of-Gates foundations and cell personalizations. This paper discusses the performance and area impacts these structures make to gate-array chips and cell libraries. Results from fabricated CrossCheck devices are presented
  • Keywords
    application specific integrated circuits; built-in self test; integrated circuit testing; logic arrays; logic testing; ASIC testing; CrossCheck built-in test techniques; cell libraries; cell personalizations; design considerations; gate-array chips; sea of gates foundations; Built-in self-test; Circuit faults; Circuit testing; Electronic equipment testing; Hardware; Libraries; Manufacturing; Monitoring; Probes; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
  • Conference_Location
    Rochester, NY
  • Print_ISBN
    0-7803-0101-3
  • Type

    conf

  • DOI
    10.1109/ASIC.1991.242911
  • Filename
    242911
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=3350595