Title :
Optical tracking using projective invariant marker pattern properties
Author :
Van Liere, Robert ; Mulder, Jurriaan D.
Author_Institution :
Dept. of Inf. Syst., Centre for Math. & Comput. Sci., Amsterdam, Netherlands
Abstract :
We describe a novel optical tracker algorithm for the tracking of interaction devices in virtual and augmented reality. The tracker uses invariant properties of marker patterns to efficiently identify and reconstruct the pose of these interaction devices. Since invariant properties are sensitive to noise in the 2D marker positions, an offline training session is used to determine deviations in these properties. These deviations are taken into account when searching for the patterns once the tracker is used.
Keywords :
computational geometry; optical tracking; virtual reality; 2D marker positions; augmented reality; interaction device tracking; marker patterns; offline training session; optical tracker algorithm; optical tracking; projective invariant marker pattern properties; virtual reality; Computer science; Computer vision; Image processing; Image reconstruction; Information systems; Mathematics; Optical devices; Optical noise; Optical sensors; Virtual reality;
Conference_Titel :
Virtual Reality, 2003. Proceedings. IEEE
Print_ISBN :
0-7695-1882-6
DOI :
10.1109/VR.2003.1191138