Using optimization in circuit design to improve the yield and circuit performance

Author

Doganis, Kyriakos ; Linardes, Panos

Author_Institution

Electrical Engineering Software Inc., Santa Clara, CA, USA

fYear

1991

fDate

23-27 Sep 1991

Lastpage

38899

Abstract

Circuit simulation, circuit optimization, sensitivity analysis and yield analysis and optimization tools are integrated in the OPSIM system and support a design methodology that improves designer productivity, circuit performance, manufacturing yield and longterm reliability in ICs. Values for circuit parameters are automatically determined to meet a target performance while accounting for process extremes and environmental conditions

Keywords

application specific integrated circuits; circuit CAD; circuit analysis computing; design engineering; linear integrated circuits; optimisation; reliability; sensitivity analysis; ASIC; OPSIM system; circuit design optimisation; circuit optimization; circuit performance; design methodology; designer productivity; longterm reliability; manufacturing yield; optimization tools; sensitivity analysis; yield analysis; Circuit optimization; Circuit simulation; Circuit synthesis; Design methodology; Design optimization; Integrated circuit manufacture; Integrated circuit yield; Performance analysis; Productivity; Sensitivity analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-0101-3

Type

conf

DOI

10.1109/ASIC.1991.242935

Filename

242935