Title :
The variation of piezoelectric and electrostrictive strain as a function of frequency and applied electric field using an interferometric technique
Author :
Ren, W. ; Masys, A.J. ; Yang, G. ; Mukherjee, B.K.
Author_Institution :
Dept. of Phys., R. Mil. Coll. of Canada, Kingston, Ont., Canada
Abstract :
A Zygo laser interferometer system has been used to measure the strain induced in piezoelectric lead zirconate titanate (PZT) and electrostrictive lead magnesium niobate (PMN) based ceramics. The piezoelectric coefficients d33, d31 and d15 of PZT ceramics have been determined as a function of electric field and frequency. The strain and polarization of PMN-PT ceramics have been measured at AC fields of up to 4 MV/m. For PMN-based ceramics, the results suggest that a quadratic relation of strain with polarization (S=Q·P2) is not valid at high electric fields and higher order terms must be considered. DC bias measurements at room temperature showed that the maximum d33 of PMN-15 ceramics was 800 pm/V at the bias field of 0.67 MV/m and had little frequency dependence in the frequency range from 1 Hz up to 2.5 kHz. However, PMN-38 ceramic, with a maximum d33 of 1200 pm/V at the bias field of 0.43 MV/m, showed frequency dependence from 1 Hz up to 2.5 kHz
Keywords :
ceramics; dielectric polarisation; electric fields; electrostriction; lead compounds; light interferometry; magnesium compounds; measurement by laser beam; piezoceramics; strain measurement; 1 Hz to 2.5 kHz; AC fields; DC bias measurements; PMN-15 ceramic; PMN-38 ceramic; PZT; PbMgNbO3; PbMgNbO3 based ceramic; PbZrO3TiO3; Zygo laser interferometer system; applied electric field; electrostrictive PMN based ceramics; electrostrictive strain variation; frequency range; high electric fields; higher order terms; piezoelectric PZT based ceramics; piezoelectric coefficients; piezoelectric strain variation; polarization; Capacitive sensors; Ceramics; Electric fields; Electrostriction; Frequency dependence; Magnesium; Niobium compounds; Strain measurement; Temperature measurement; Titanium compounds;
Conference_Titel :
Applications of Ferroelectrics, 2000. ISAF 2000. Proceedings of the 2000 12th IEEE International Symposium on
Conference_Location :
Honolulu, HI
Print_ISBN :
0-7803-5940-2
DOI :
10.1109/ISAF.2000.941517