Title :
Radiation and life test procedures for military and aerospace ASIC components
Author :
Chrusciel, Richard W.
Author_Institution :
ETEC Inc., West Peabody, MA, USA
Abstract :
Presents part qualification, characterization and test/screening procedures for ASICs, intended for military and aerospace use. These procedures provide quick and low cost evaluation of commercial technology transferred to mil/aerospace systems
Keywords :
aerospace instrumentation; application specific integrated circuits; environmental testing; inspection; integrated circuit testing; life testing; military equipment; radiation hardening (electronics); ASIC testing; aerospace ASIC components; burn-in; characterization; commercial technology; life test procedures; low cost evaluation; military ASIC components; part qualification; radiation test procedures; screening procedures; Aerospace testing; Application specific integrated circuits; Costs; Life testing; Logic; Production systems; Prototypes; Qualifications; Silicon; Space technology;
Conference_Titel :
ASIC Conference and Exhibit, 1991. Proceedings., Fourth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-0101-3
DOI :
10.1109/ASIC.1991.242942
