Title :
Room-temperature CW Operation Of GaAs/AlGaAs Diode Lasers Grown An Sificon-on-insulator Wafers
Author :
Choi, H.K. ; Wang, C.A. ; Karam, N.H.
Author_Institution :
Massachusetts Institute of Technology
Keywords :
Diode lasers; Gallium arsenide; Life testing; Materials testing; Optical materials; Photoluminescence; System testing; Temperature; Thermal resistance; Threshold current;
Conference_Titel :
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
Print_ISBN :
0-87942-550-4
DOI :
10.1109/LEOS.1990.690652