Title : 
Room-temperature CW Operation Of GaAs/AlGaAs Diode Lasers Grown An Sificon-on-insulator Wafers
         
        
            Author : 
Choi, H.K. ; Wang, C.A. ; Karam, N.H.
         
        
            Author_Institution : 
Massachusetts Institute of Technology
         
        
        
        
        
        
            Keywords : 
Diode lasers; Gallium arsenide; Life testing; Materials testing; Optical materials; Photoluminescence; System testing; Temperature; Thermal resistance; Threshold current;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics Society Annual Meeting, 1990. LEOS '90. Conference Proceedings., IEEE
         
        
            Print_ISBN : 
0-87942-550-4
         
        
        
            DOI : 
10.1109/LEOS.1990.690652