• DocumentCode
    3351243
  • Title

    Second harmonic generation from Si/SiO/sub 2/: spectral and symmetry characteristics

  • Author

    Wright, J.T. ; Cundiff, S.T. ; Evans-Lutterodt, K.W. ; Green, M.L.

  • Author_Institution
    Joint Inst. for Lab. Astrophys., Nat. Inst. of Stand. & Technol., Boulder, CO, USA
  • fYear
    1992
  • fDate
    23-28 May 1992
  • Firstpage
    246
  • Lastpage
    247
  • Abstract
    Summary form only given. Second harmonic generation (SHG) only occurs, in the dipole approximation, in material that is noninversion symmetric. Consequently, in material with bulk inversion symmetry, SHG only occurs near a surface or an interface that breaks the inversion symmetry. Substantial interest has been paid to SHG from the Si(100)-SiO/sub 2/ interface because of its importance to the semiconductor industry. Results showing that SHG is sensitive to roughness at this interface have only furthered interest. Roughness is becoming critical as MOSFET gate oxide thickness shrinks to nanometer scale with shrinking gate dimension.
  • Keywords
    interface phenomena; optical harmonic generation; rough surfaces; silicon; silicon compounds; symmetry; MOSFET gate oxide thickness; SHG; Si(100)-SiO/sub 2/ interface; Si-SiO/sub 2/; Si/SiO/sub 2/; bulk inversion symmetry; dipole approximation; interfa; inversion symmetry; nanometer scale; noninversion symmetric; roughness; second harmonic generation; semiconductor industry; shrinking gate dimension; spectral characteristics; surface; symmetry characteristics; Free electron lasers; Frequency conversion; Gratings; Laser modes; Optical coupling; Optical harmonic generation; Optical surface waves; Polarization; Spectroscopy; Tunable circuits and devices;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-576-X
  • Type

    conf

  • DOI
    10.1109/QELS.1999.807624
  • Filename
    807624