Title :
Programmable power supply system for SiPM bias
Author :
Gil, A. ; Rodriguez, J. ; Alvarez, V. ; Diaz, J. ; Gomez-Cadenas, JJ ; Lorca, D.
Author_Institution :
Inst. de Fis. Corpuscular, Univ. de Valencia, Valencia, Spain
Abstract :
NEXT is a double beta decay experiment that will be operated in Canfranc Underground Laboratory (Spain). The goal of the NEXT Collaboration is to search for ββ0ν decays of the 136Xe isotope. This challenge can be met with a 100 kg High Pressure enriched Xenon TPC. One key issue of such a TPC will be an excellent energy resolution, which can only be achieved if the TPC is operated in electroluminescent mode. This mode provides two different signals: primary scintillation (weak and fast) and electroluminescence light (strong and slow). The tracking system will be done with TPB coated SiPMs sensitive to ultraviolet light. A prototype of TPC called NEXT1-IFIC is equipped with about 250 SiPMs that require stable bias supply voltage. Within this context, a programmable microcontroller-based power supply board has been developed in order to monitor and program the bias voltages to the required values with convenient accuracy. The system is based on an ATMEL microcontroller, which can be controlled via USB. The system is equipped with high resolution ADCs and DACs to obtain resolutions of the order of decants of milivolts.
Keywords :
analogue-digital conversion; digital-analogue conversion; double beta decay; microcontrollers; peripheral interfaces; power supply circuits; programmable circuits; radioisotopes; scintillation; time projection chambers; virtual instrumentation; xenon; ATMEL microcontroller; Canfranc Underground Laboratory; NEXT double beta decay experiment; NEXT1-IFIC prototype; SiPM bias; TPB coated SiPM; USB; bias voltage monitoring; electroluminescence light; electroluminescent mode TPC operation; high pressure enriched Xenon TPC; high resolution ADC; high resolution DAC; primary scintillation; programmable microcontroller-based power supply board; tracking system; Indexes; Microcontrollers; NEXT; SiPM power supply; SiPM temperature compensation;
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
Print_ISBN :
978-1-4673-0118-3
DOI :
10.1109/NSSMIC.2011.6154298