Title :
Large-scale neuroanatomical visualization using a manifold embedding approach
Author :
Joshi, Shantanu H. ; Bowman, Ian ; Van Horn, John Darrell
Author_Institution :
Dept. of Neurology, Univ. of California, Los Angeles, CA, USA
Abstract :
We present a unified framework for data processing, mining and interactive visualization of large-scale neuroanatomical databases. The input data is assumed to lie in a specific atlas space, or simply exist as a separate collection. Users can specify their own atlas for comparative analyses. The original data exist as MRI images in standard formats. It is uploaded to a remote server and processed offline by a parallelized pipeline workflow. This workflow transforms the data to represent it as both volumetric and triangular mesh cortical surfaces. We use multiresolution representations to scale complexity to data storage availability as well as graphical processing performance. Our workflow implements predefined metrics for clustering and classification, and data projection schemes to aid in visualization. Additionally the system provides a visual query interface for performing selection requests based on user-defined search criteria.
Keywords :
data mining; data visualisation; image resolution; magnetic resonance imaging; medical image processing; neurophysiology; solid modelling; Large scale performance; MRI image; data interactive visualization; data mining; data processing; data projection scheme; data storage availability; graphical processing; manifold embedding approach; multiresolution representation; neuroanatomical visualization; parallelized pipeline workflow; remote server; scale complexity; specific atlas space; standard format; triangular mesh cortical surface; user defined search criteria; visual query interface; Brain; Data visualization; Face; Feature extraction; Informatics; Neuroimaging; Three dimensional displays; I.3 [Computer Graphics]: Three-Dimensional Graphics and Realism; I.3.3 [Viewing Algorithms]; I.3.8 [Applications];
Conference_Titel :
Visual Analytics Science and Technology (VAST), 2010 IEEE Symposium on
Conference_Location :
Salt Lake City, UT
Print_ISBN :
978-1-4244-9488-0
Electronic_ISBN :
978-1-4244-9487-3
DOI :
10.1109/VAST.2010.5652532