• DocumentCode
    3351762
  • Title

    2D and 3D thin pixel technologies for the Layer0 of the SuperB Silicon Vertex Tracker

  • Author

    Giorgia, F. ; Avanzini, C. ; Batignani, G. ; Bettarini, S. ; Bosi, F. ; Casarosa, G. ; Ceccanti, M. ; Cervelli, A. ; Forti, F. ; Giorgi, M.A. ; Mammini, P. ; Morsani, F. ; Oberho, B. ; Paoloni, E. ; Perez, A. ; Profeti, A. ; Rizzo, G. ; Walsh, J. ; Lusian

  • Author_Institution
    INFN, Univ. degli Studi di Bologna, Bologna, Italy
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    1324
  • Lastpage
    1328
  • Abstract
    The high luminosity asymmetric e+e- collider SuperB, recently approved by the Italian Government, is designed to deliver a luminosity greater than 1036cm-2s-1 with moderate beam currents and a reduced center of mass boost with respect to earlier B-Factories. An improved vertex resolution is required for precise time-dependent measurements and the SuperB Silicon Vertex Tracker will be equipped with an innermost layer of small radius (about 1.5 cm), resolution of 10 μm in both coordinates, low material budget (<;1% X0), and able to withstand a hit background rate of several tens of MHz/cm2. The ambitious goal of designing a thin pixel device matching these stringent requirements is being pursued with specific R&D programs on different technologies: CMOS MAPS, pixel sensors in vertical integration technology and hybrid pixels with small pitch and reduced material budget. The latest results on the characterization of the various pixel devices realized for the SuperB Layer0 will be presented.
  • Keywords
    CMOS integrated circuits; monolithic integrated circuits; readout electronics; semiconductor counters; 2D thin pixel technologies; 3D thin pixel technologies; B-factory; CMOS MAPS; SuperB SVT layer0; SuperB Silicon Vertex Tracker; high luminosity asymmetric electron-positron collider; hit background rate; hybrid pixels; pixel sensors; thin pixel device; time dependent measurements; vertex resolution; vertical integration technology; Atmospheric measurements; Chirp; Clocks; MOS devices; Neutrons; Particle measurements; Silicon; 3D-IC; MAPS; SVT; SuperB; fast readout; hybrid pixels; pixel; test beam; tracker; vertical integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6154335
  • Filename
    6154335