DocumentCode :
3351762
Title :
2D and 3D thin pixel technologies for the Layer0 of the SuperB Silicon Vertex Tracker
Author :
Giorgia, F. ; Avanzini, C. ; Batignani, G. ; Bettarini, S. ; Bosi, F. ; Casarosa, G. ; Ceccanti, M. ; Cervelli, A. ; Forti, F. ; Giorgi, M.A. ; Mammini, P. ; Morsani, F. ; Oberho, B. ; Paoloni, E. ; Perez, A. ; Profeti, A. ; Rizzo, G. ; Walsh, J. ; Lusian
Author_Institution :
INFN, Univ. degli Studi di Bologna, Bologna, Italy
fYear :
2011
fDate :
23-29 Oct. 2011
Firstpage :
1324
Lastpage :
1328
Abstract :
The high luminosity asymmetric e+e- collider SuperB, recently approved by the Italian Government, is designed to deliver a luminosity greater than 1036cm-2s-1 with moderate beam currents and a reduced center of mass boost with respect to earlier B-Factories. An improved vertex resolution is required for precise time-dependent measurements and the SuperB Silicon Vertex Tracker will be equipped with an innermost layer of small radius (about 1.5 cm), resolution of 10 μm in both coordinates, low material budget (<;1% X0), and able to withstand a hit background rate of several tens of MHz/cm2. The ambitious goal of designing a thin pixel device matching these stringent requirements is being pursued with specific R&D programs on different technologies: CMOS MAPS, pixel sensors in vertical integration technology and hybrid pixels with small pitch and reduced material budget. The latest results on the characterization of the various pixel devices realized for the SuperB Layer0 will be presented.
Keywords :
CMOS integrated circuits; monolithic integrated circuits; readout electronics; semiconductor counters; 2D thin pixel technologies; 3D thin pixel technologies; B-factory; CMOS MAPS; SuperB SVT layer0; SuperB Silicon Vertex Tracker; high luminosity asymmetric electron-positron collider; hit background rate; hybrid pixels; pixel sensors; thin pixel device; time dependent measurements; vertex resolution; vertical integration technology; Atmospheric measurements; Chirp; Clocks; MOS devices; Neutrons; Particle measurements; Silicon; 3D-IC; MAPS; SVT; SuperB; fast readout; hybrid pixels; pixel; test beam; tracker; vertical integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
Conference_Location :
Valencia
ISSN :
1082-3654
Print_ISBN :
978-1-4673-0118-3
Type :
conf
DOI :
10.1109/NSSMIC.2011.6154335
Filename :
6154335
Link To Document :
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