• DocumentCode
    3351781
  • Title

    Film line scratch detection using neural network and morphological filter

  • Author

    Kim, Kyung-Tai ; Kim, Eun Yi

  • Author_Institution
    Dept. of Adv. Technol. fusion, Konkuk Univ., Seoul
  • fYear
    2008
  • fDate
    21-24 Sept. 2008
  • Firstpage
    1007
  • Lastpage
    1011
  • Abstract
    This paper presents a scratch detection method that automatically detects all kinds of scratches from each frame in old films. Generally, the scratch in old films has lower or higher brightness than neighboring pixels in its vicinity and it usually appears as a vertically long thin line. The proposed method is designed from these characteristics of a scratch, thus it consists of two major modules: a neural network-based texture classifier and a morphology-based shape filter with multiple structuring elements. First, the NN-based texture classifier divides the input image into scratch regions and non-scratch regions using the texture property of the scratch. Secondly, the morphology-based shape filter confirms the classified scratch region with structuring elements which is designed based on the shape characteristics of scratches. To assess the validity of the proposed method, the experiments have been performed on several old films and an animation, then the results confirms that the proposed method can detect all kinds of scratches and have the potential to be applied to the commercial systems.
  • Keywords
    cinematography; filtering theory; image restoration; image texture; neural nets; object detection; pattern classification; film line scratch detection; film restoration; morphology-based shape filter; neural network; texture classifier; Animation; Brightness; Degradation; Design methodology; Filters; Image reconstruction; Image restoration; Motion pictures; Neural networks; Shape; film restoration; morphological filter; neural nerwork;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Cybernetics and Intelligent Systems, 2008 IEEE Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-1673-8
  • Electronic_ISBN
    978-1-4244-1674-5
  • Type

    conf

  • DOI
    10.1109/ICCIS.2008.4670903
  • Filename
    4670903