Title :
Signature of resonant Rayleigh scattering from microcavity polaritons: angularly peaked coherent emission
Author :
Bloch, J. ; Birkedal, D. ; Shah, J. ; Thierry-Mieg, V.
Author_Institution :
Lucent Technol., AT&T Bell Labs., Holmdel, NJ, USA
Abstract :
Summary form only given. We unambiguously identify resonant Rayleigh scattering in a semiconductor microcavity using ultrafast spectral interferometry and demonstrate that this coherent emission is restricted to a cone defined by the excitation wave-vector, in contrast to isotropic luminescence. The sample is a /spl lambda/ GaAs cavity with a single 8 nm Ga/sub 0.96/In/sub 0.04/As quantum well at the anti-node, surrounded by two Ga/sub 0.9/Al/sub 0.1/As/AlAs Bragg mirrors.
Keywords :
III-V semiconductors; Rayleigh scattering; gallium arsenide; high-speed optical techniques; indium compounds; light interferometry; optical resonators; polaritons; semiconductor quantum wells; 8 nm; Ga/sub 0.9/Al/sub 0.1/As-AlAs; Ga/sub 0.9/Al/sub 0.1/As/AlAs Bragg mirrors; Ga/sub 0.96/In/sub 0.04/As quantum well; GaAs cavity; GaAs-Ga/sub 0.96/In/sub 0.04/As; angularly peaked coherent emission; anti-node; cone; excitation wave-vector; isotropic luminescence; microcavity polaritons; resonant Rayleigh scattering; semiconductor microcavity; ultrafast spectral interferometry; Electromagnetic interference; Excitons; Laser beams; Laser excitation; Microcavities; Mirrors; Quantum well lasers; Rayleigh scattering; Resonance; Wavelength measurement;
Conference_Titel :
Quantum Electronics and Laser Science Conference, 1999. QELS '99. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-576-X
DOI :
10.1109/QELS.1999.807672
