• DocumentCode
    3352118
  • Title

    A time-pickoff method using automatic gain control for a fast count rate

  • Author

    Lim, Hansang

  • Author_Institution
    Dept. of Electron. Convergence Eng., Kwangwoon Univ., Seoul, South Korea
  • fYear
    2011
  • fDate
    23-29 Oct. 2011
  • Firstpage
    1510
  • Lastpage
    1514
  • Abstract
    The response time of a comparator involved in a time-pickoff circuit depends on the overdrive and the slope of its input signal, which is the main cause of a timing error. For eliminating the dependency, a time pickoff method employing an automatic gain control (AGC) circuit renders the amplitude of the input signal to the comparator to be uniform. However, its application is limited to the low count rate measurement due to relatively long delay of the nonlinear bias circuit for controlling the gain in the AGC circuit. In this study, a time pickoff method, which employs an automatic gain control circuit with a shorter delay, is proposed for fast count rate measurements. According to the amplitude, the input signal is divided into 4 steps. Then, the gain in the AGC circuit is set to be same for the input signals of the same step, which is basically inversely proportional to the amplitude. This gain setting is performed at one time by amplitude comparison, which is similar to a flash type analog-to-digital converter (ADC) structure, and has a smaller propagation delay. The performance of the proposed method is analyzed through the experiments for input signals with a dynamic range of 40dB.
  • Keywords
    automatic gain control; comparators (circuits); nuclear electronics; timing circuits; automatic gain control circuit; comparator; fast count rate measurement; flash type analog-to-digital converter structure; input signal amplitude; nonlinear bias circuit; propagation delay; response time; time-pickoff method; timing error; Accuracy; Gain control; Lead;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE
  • Conference_Location
    Valencia
  • ISSN
    1082-3654
  • Print_ISBN
    978-1-4673-0118-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2011.6154361
  • Filename
    6154361