DocumentCode
3352182
Title
Circuit pack troubleshooting via semantic control. I. Goal selection
Author
Lirov, Yuval ; Yue, On-Ching
Author_Institution
AT&T Bell Lab., Holmdel, NJ, USA
fYear
1988
fDate
25-27 May 1988
Firstpage
118
Lastpage
122
Abstract
Design and analysis issues of automated diagnostic and repair stations for circuit packs are discussed. It is shown that an adoption of a control-theoretic point of view of the entire diagnostic process yields several advantages over the traditional approaches. First, the functionality of the system may be naturally modeled. Second, using the constructed model it is possible to define an adaptive control system which performs in real-time the optimal diagnostic/repair sequence of actions. Third, a natural decomposition of the control system into three cooperating yet independent subsystems is obtained, the techniques of artificial intelligence are used for efficient implementation of the subsystems. In particular, an expert systems approach is used for two of the above systems. The third (supervising) system is implemented as a heuristic search procedure. The paper concentrates on the design and implementation issues of the supervising subsystem.<>
Keywords
adaptive control; artificial intelligence; automatic testing; electronic equipment testing; expert systems; fault location; heuristic programming; adaptive control system; artificial intelligence; automated diagnostic stations; automated repair stations; circuit pack troubleshooting; diagnostic process; expert systems; goal selection; heuristic search procedure; optimal diagnostic/repair sequence; real-time; semantic control; subsystems; Adaptive control; Artificial intelligence; Automatic control; Circuit faults; Circuit testing; Control system analysis; Control systems; Expert systems; Performance evaluation; Process control;
fLanguage
English
Publisher
ieee
Conference_Titel
Artificial Intelligence for Industrial Applications, 1988. IEEE AI '88., Proceedings of the International Workshop on
Conference_Location
Hitachi City, Japan
Type
conf
DOI
10.1109/AIIA.1988.13280
Filename
13280
Link To Document