DocumentCode :
3352228
Title :
Watermark survival chance (WSC) concept for improving watermark robustness against JPEG compression
Author :
Nezhadarya, Ehsan ; Wang, Z. Jane ; Ward, Rabab K.
Author_Institution :
Dept. of Electr. & Comput. Eng., Univ. of British Columbia, Vancouver, BC, Canada
fYear :
2010
fDate :
26-29 Sept. 2010
Firstpage :
3697
Lastpage :
3700
Abstract :
This paper presents the new concept of watermark survival chance (WSC) for improving watermark robustness. WSC provides a robustness measure for an image feature (e.g. a discrete wavelet transform (DWT) coefficient) when used for watermark embedding, and thus can provide the watermark designer with prior knowledge on robust image features. As an illustrative example, we study additive spread spectrum watermarking in the DWT domain and consider JPEG compression as the attack. WSC is obtained for each DWT coefficient/subband for different compression ratios. Based on the WSC table for JPEG compression distortion, we suggest that: Wavelet coefficients can be divided into two main categories: block boundary coefficients and block non-boundary coefficients; block boundary coefficients generally are more robust for watermark embedding than block non-boundary coefficients; larger scale wavelet coefficients are generally more robust than smaller scales; a vertical subband is slightly preferred at small and large scales, while a horizontal subband is preferred at a medium scale.
Keywords :
discrete wavelet transforms; image coding; watermarking; JPEG compression; additive spread spectrum watermarking; block boundary coefficients; block nonboundary coefficients; discrete wavelet transform coefficient; image feature; watermark robustness; watermark survival chance concept; Discrete cosine transforms; Discrete wavelet transforms; Image coding; Robustness; Transform coding; Watermarking; Image watermarking; JPEG compression; robustness improvement; spread spectrum; wavelet transform;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location :
Hong Kong
ISSN :
1522-4880
Print_ISBN :
978-1-4244-7992-4
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2010.5652589
Filename :
5652589
Link To Document :
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