Fast, low-noise, low-power electronics for the analog readout of non-linear DEPFET pixels

Author

Facchinetti, Stefano ; Bombelli, Luca ; Castoldi, Andrea ; Fiorini, Carlo ; Guazzoni, Chiara ; Mezza, Davide ; Porro, Matteo ; De Vita, Giulio ; Erdinger, Florian

Author_Institution

Dipt. di Elettron. e Inf., Politec. di Milano, Milan, Italy

fYear

2011

fDate

23-29 Oct. 2011

Firstpage

1846

Lastpage

1851

Abstract

A high speed focal plane system and a novel non linear DEPFET detector are under development to comply with the European X-ray Free Electron Laser (XFEL) requirements. The facility is under construction in the Hamburg area (Germany) and will be able to deliver ultra short, high intensity X-ray pulses 220ns apart and grouped in macro bunches with a repetition rate of 10Hz. DEPFETs have been chosen since they can provide excellent energy resolution and high speed readout. Full parallel readout is required, with every channel comprising analog filtering, data conversion and memory storage. Here we present results for the first prototype of the analog front end stage, that implements a current readout approach. The circuit is based on the Flip Capacitor Filter technique and was realized in 130nm 1.2V CMOS technology from IBM.

Keywords

CMOS analogue integrated circuits; free electron lasers; nuclear electronics; readout electronics; semiconductor counters; CMOS technology; European X-ray Free Electron Laser; Hamburg area; X-ray pulses; analog filtering; analog readout; data conversion; flip capacitor filter technique; high speed focal plane system; low-noise electronic; low-power electronic; macro bunches; memory storage; nonlinear DEPFET detector; nonlinear DEPFET pixels; parallel readout; repetition rate; Decision support systems; Linearity; Silicon compounds; Timing; Weight measurement; X-ray lasers; Current readout; Flip Capacitor Filter; XFEL; time-variant filter; trapezoidal weighting function;

fLanguage

English

Publisher

ieee

Conference_Titel

Nuclear Science Symposium and Medical Imaging Conference (NSS/MIC), 2011 IEEE

Conference_Location

Valencia

ISSN

1082-3654

Print_ISBN

978-1-4673-0118-3

Type

conf

DOI

10.1109/NSSMIC.2011.6154371

Filename

6154371