DocumentCode :
3352718
Title :
A new capacitance measurement method for imaging of permittivity distribution
Author :
Kimoto, Akira ; Matsuoka, Yasutaka ; Shida, Katsunori
Author_Institution :
Dept. of Electr. Eng., Saga Univ., Japan
Volume :
5
fYear :
1996
fDate :
31 Oct-3 Nov 1996
Firstpage :
1940
Abstract :
The final purpose of the authors´ study is the imaging of changed temperature distribution inside the human head by non-invasive measurement. To achieve this purpose, the authors investigated the imaging of permittivity distribution by measuring capacitance because permittivity depends on temperature and the measurement of capacitance gives one information about permittivity. This paper describes a new capacitance measurement method for estimating the permittivity distribution of an object. A regularization method based on a modified Newton-Raphson method, and the finite element method are used to obtain the imaging of permittivity distribution. The authors present the reconstruction image of an agar-agar placed into a homogeneous phantom. As a result, the authors suggest that it is possible to image permittivity distribution using the proposed new capacitance measurement method
Keywords :
Newton-Raphson method; bioelectric phenomena; biomedical measurement; capacitance measurement; finite element analysis; permittivity measurement; temperature distribution; agar-agar; capacitance measurement method; changed temperature distribution; homogeneous phantom; human head; medical diagnostic imaging; modified Newton-Raphson method; noninvasive measurement; permittivity distribution imaging; reconstruction image; regularization method; Capacitance measurement; Finite element methods; Head; Humans; Image reconstruction; Newton method; Permittivity measurement; Temperature dependence; Temperature distribution; Temperature measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 1996. Bridging Disciplines for Biomedicine. Proceedings of the 18th Annual International Conference of the IEEE
Conference_Location :
Amsterdam
Print_ISBN :
0-7803-3811-1
Type :
conf
DOI :
10.1109/IEMBS.1996.646330
Filename :
646330
Link To Document :
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