• DocumentCode
    3352880
  • Title

    Measuring the error between actual and estimated atmospherics and the effect on estimating reflectance profiles

  • Author

    Yarbrough, Allan W. ; Mendenhall, Michael J. ; Fiorino, Steven T.

  • Author_Institution
    Dept of Electr. & Comput. Eng., Air Force Inst. of Technol., Wright-Patterson AFB, OH, USA
  • fYear
    2010
  • fDate
    25-30 July 2010
  • Firstpage
    3588
  • Lastpage
    3591
  • Abstract
    Accurate target detection and classification of hyperspectral imagery require that the measurement by the imager matches as closely as possible the known “true” target as collected under controlled conditions. Therefore, the effect of the radiation source and the atmosphere must be factored out of the result before detection is attempted. Our objective is to investigate the relationship between uncertainty in the estimation of target spectra and uncertainty in the estimation of atmospherics. We apply a range of atmospheric profiles to a MODTRAN-based prediction of the radiative transfer effect. These profiles are taken from known distribution percentiles as obtained from historic meteorological measurements at the chosen site. We calculate the change in radiative transfer effects as measured by the Euclidean distance, given the range of atmospheric conditions in the historic profile, and show that changes in the atmospheric assumptions change the total transmission, spectral radiance, and estimated reflectance.
  • Keywords
    geophysical image processing; geophysics computing; object detection; radiative transfer; Euclidean distance; MODTRAN-based prediction; atmospheric conditions; atmospheric profiles; distribution percentiles; hyperspectral imagery; imager matches; radiation source; radiative transfer effect; reflectance profiles; spectral radiance; target detection; total transmission; Atmospheric measurements; Atmospheric modeling; Humidity; Hyperspectral imaging; Temperature measurement; Water;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Geoscience and Remote Sensing Symposium (IGARSS), 2010 IEEE International
  • Conference_Location
    Honolulu, HI
  • ISSN
    2153-6996
  • Print_ISBN
    978-1-4244-9565-8
  • Electronic_ISBN
    2153-6996
  • Type

    conf

  • DOI
    10.1109/IGARSS.2010.5652635
  • Filename
    5652635