DocumentCode :
3353069
Title :
Measurement of Frequency Dependent Dielectric Properties by the Capacitance Technique
Author :
Matiss, Imants ; Purvinsh, Andris
Author_Institution :
Latvian Acad. of Sci., Riga
Volume :
4
fYear :
2006
fDate :
9-13 July 2006
Firstpage :
2743
Lastpage :
2746
Abstract :
Measurement model of a capacitor designed for nondestructive testing (NDT) of dielectric materials in a frequency range is proposed. The capacitor, which is a source of electric field, fulfills also functions of a sensor. Proposed design involves electrodes, which are placed on the surface of a test objects, and therefore, secures unilateral access for testing. Particular case with electrodes of the capacitor located in one plane is discussed more in details.
Keywords :
capacitance; capacitors; dielectric materials; dielectric measurement; electrodes; nondestructive testing; capacitance technique; capacitor; dielectric materials; dielectric properties; electric field; nondestructive testing; Capacitance measurement; Capacitors; Conducting materials; Dielectric materials; Dielectric measurements; Electrodes; Electromagnetic measurements; Frequency dependence; Frequency measurement; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics, 2006 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
1-4244-0496-7
Electronic_ISBN :
1-4244-0497-5
Type :
conf
DOI :
10.1109/ISIE.2006.296048
Filename :
4078824
Link To Document :
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