DocumentCode
3353219
Title
Image tampering detection based on stationary distribution of Markov chain
Author
Wang, Wei ; Dong, Jing ; Tan, Tieniu
Author_Institution
Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
fYear
2010
fDate
26-29 Sept. 2010
Firstpage
2101
Lastpage
2104
Abstract
In this paper, we propose a passive image tampering detection method based on modeling edge information. We model the edge image of image chroma component as a finite-state Markov chain and extract low dimensional feature vector from its stationary distribution for tampering detection. The support vector machine (SVM) is utilized as classifier to evaluate the effectiveness of the proposed algorithm. The experimental results in a large scale of evaluation database illustrates that our proposed method is promising.
Keywords
Markov processes; edge detection; feature extraction; image classification; image colour analysis; support vector machines; SVM; edge information modeling; finite-state Markov chain; image chroma component; image classifier; image tampering detection; low dimensional feature vector; stationary distribution; support vector machine; Color; Databases; Feature extraction; Image edge detection; Markov processes; Pixel; Splicing; Markov chain; image chroma; stationary distribution; tampering detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Image Processing (ICIP), 2010 17th IEEE International Conference on
Conference_Location
Hong Kong
ISSN
1522-4880
Print_ISBN
978-1-4244-7992-4
Electronic_ISBN
1522-4880
Type
conf
DOI
10.1109/ICIP.2010.5652660
Filename
5652660
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