• DocumentCode
    3353219
  • Title

    Image tampering detection based on stationary distribution of Markov chain

  • Author

    Wang, Wei ; Dong, Jing ; Tan, Tieniu

  • Author_Institution
    Nat. Lab. of Pattern Recognition, Chinese Acad. of Sci., Beijing, China
  • fYear
    2010
  • fDate
    26-29 Sept. 2010
  • Firstpage
    2101
  • Lastpage
    2104
  • Abstract
    In this paper, we propose a passive image tampering detection method based on modeling edge information. We model the edge image of image chroma component as a finite-state Markov chain and extract low dimensional feature vector from its stationary distribution for tampering detection. The support vector machine (SVM) is utilized as classifier to evaluate the effectiveness of the proposed algorithm. The experimental results in a large scale of evaluation database illustrates that our proposed method is promising.
  • Keywords
    Markov processes; edge detection; feature extraction; image classification; image colour analysis; support vector machines; SVM; edge information modeling; finite-state Markov chain; image chroma component; image classifier; image tampering detection; low dimensional feature vector; stationary distribution; support vector machine; Color; Databases; Feature extraction; Image edge detection; Markov processes; Pixel; Splicing; Markov chain; image chroma; stationary distribution; tampering detection;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2010 17th IEEE International Conference on
  • Conference_Location
    Hong Kong
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-7992-4
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2010.5652660
  • Filename
    5652660